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Plasma Focused Ion Beam (PFIB) Lab
The PFIB lab is meant as a national infrastructure for nanoscience and nanotechnology research. The substantial characterization capabilities make this instrument unique. The dual beam is equipped with several detectors such as a retractable backscattered electron detector, retractable S(T)EM detector, EDS, EBSD, and ToF-SIMS. This combination can be used for a deep understanding of the microstructure, crystallographic orientations, chemical composition, and surface/sub-surface topography of different types of material.
PFIB G5 (Helios 5 PFIB CXe DualBeam)
Richard Birkelands Vei 2B